Browsing by Author "Kuper, F. G."
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Publication Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Journal article1994, Quality and Reliability Engineering International, 10, p.325-334Publication Fast transient ESD simulation of the NMOS protection transistor
Publication Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Journal article1997, IEEE Trans. Electron Devices, (44) 11, p.1972-1980