Browsing by Author "Kurz, H."

Now showing 1 - 6 of 6

Charge pumping and mobility measurements on strained SOI MOSFETs

Schmidt, M.
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Gottlob, H. D. B.
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Echermeyer, T.
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Wahlbrink, T.
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Mollenhauer, T.
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Baus, M.
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Buca, D.M.
Proceedings paper
2007, 8th European Workshop on ULtimate Integration of Silicon - ULIS, 14/03/2007
Fabrication of photonic components by nanoimprint technology within ePIXnet

Plachetka, U.
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Kristensen, A.
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Scheerlinck, Stijn
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Huskens, J.
;
Koo, N.
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Kurz, H.
Journal article
2008, Microelectronic Engineering, 85, p.886-889
Fabrication of photonic components by nanoimprint technology within ePIXnet

Plachetka, U.
;
Kristensen, A.
;
Scheerlinck, Stijn
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Whitbread, N.
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Huskens, J.
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Koo, N.
;
Kurz, H.
Proceedings paper
2007-09, 33rd International Conference on Micro- and Nano-Engineering - MNE0, 23/09/2007, p.573-574
Fabrication, characterization and modeling of strained SOI MOSFETs with very large effective mobility

Driussi, F.
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Esseni, D.
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Selmi, L.
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Schmidt, M.
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Lemme, M.
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Kurz, H.
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Buca, D.
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Mantl, S.
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Luysberg, M.
Proceedings paper
2007, Proceedings of the 37th European Solid-State Device Research Conference - ESSDERC, 11/09/2007, p.315-318
Influence of Pr doping and oxygen deficiency on the scattering behavior of YBa2Cu3 O7 thin films

François, Isabel
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Jaekel, C.
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Kyas, G.
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Dierickx, D.
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Van der Biest, O.
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Heeres, Rob M.
Journal article
1996, Physical Review B, (53) 18, p.12502-12508
Microwave surface impedance measurements on high-Tc superconductors

Jaekel, C.
;
François, Isabel
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Kyas, G.
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Huning, F.
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Roskos, H. G.
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Borghs, Gustaaf
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Kurz, H.
Journal article
1996, Czechoslovak Journal of Physics, (46) S2, p.1117-18