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Browsing by Author "Lacerda de Orio, R."

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    Electromigration-induced void evolution and failure of Cu/SiCN hybrid bonds

    Ceric, H.
    ;
    Zahedmanesh, Houman  
    ;
    Croes, Kristof  
    ;
    Lacerda de Orio, R.
    ;
    Selberherr, S.
    Journal article
    2023, JOURNAL OF APPLIED PHYSICS, (133) 10, p.Art. 105101

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