Browsing by Author "Larsen, Kim Kyllesbech"
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Publication Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes
Proceedings paper1995, Infrared Technology XXI; 9-13 July 1995; San Diego, CA, USA., p.465-61Publication Influence of grain boundary scattering in the infrared response of silicide Schottky barrier diodes
Journal article1996, Journal of Appl Physics, (79) 8, p.4426-4430Publication Infrared response of epitaxial and polycrystalline CoSi2 Schottky diodes
Journal article1998, Materials Science and Technology, (14) 12, p.1303-1306Publication Structural and electrical characterization of FeSix-layers (1 < X < 2) prepared by RTA of Fe layers sputtered on Si (100)
Proceedings paper1995, Rapid Thermal and Integrated Processing IV, 17/04/1995, p.389-394Publication Structural characterization of buried epitaxial b-FeSi2 layers in (111) silicon
Proceedings paper1994, Proceedings of the 13th International Conference on Electron Microscopy - ICEM, 17/07/1994, p.639-640