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Structural characterization of buried epitaxial b-FeSi2 layers in (111) silicon
Publication:
Structural characterization of buried epitaxial b-FeSi2 layers in (111) silicon
Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tavares, J.
;
Bender, Hugo
;
Larsen, Kim Kyllesbech
;
Lauwers, Anne
;
Maex, Karen
;
Van Rossum, Marc
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Abstract
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Acq. date: 2025-10-24
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Metrics
Views
2085
since deposited on 2021-09-29
435
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations