Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Last, Thorsten"

Filter results by typing the first few letters
Now showing 1 - 2 of 2
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Experimental verification of phase induced mask 3D effects in EUV imaging

    Wittebrood, Friso
    ;
    de Winter, Laurens
    ;
    Last, Thorsten
    ;
    Van Look, Lieve  
    ;
    Philipsen, Vicky  
    Proceedings paper
    2015, International Symposium on Extreme Ultraviolet Lithography - EUVL, 5/10/2015
  • Loading...
    Thumbnail Image
    Publication

    Mask 3D effect mitigation by source optimization and assist feature placement

    Van Look, Lieve  
    ;
    Mochi, Iacopo
    ;
    Philipsen, Vicky  
    ;
    Gallagher, Emily  
    ;
    Hendrickx, Eric  
    Proceedings paper
    2016, International Symposium on Extreme Ultraviolet Lithography - EUVL, 24/10/2016

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings