Browsing by Author "Lee, Frank"
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks
;Deutsch, Sergej ;Keller, Brion ;Chickermane, Vivek ;Mukherjee, SubhasishSood, NavdeepProceedings paper2012-11, IEEE International Test Conference - ITC, 6/11/2012, p.1-10Publication Test and debug strategy for TSMC CoWoS stacking process-based heterogeneous 3D-IC: A silicon study
;Goel, Sandeep K. ;Adham, Saman ;Wang, Min-Jer ;Lee, Frank ;Chickermane, VivekKeller, BrionBook chapter2019-03