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Browsing by Author "Lee, Frank"

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    DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks

    Deutsch, Sergej
    ;
    Keller, Brion
    ;
    Chickermane, Vivek
    ;
    Mukherjee, Subhasish
    ;
    Sood, Navdeep
    Proceedings paper
    2012-11, IEEE International Test Conference - ITC, 6/11/2012, p.1-10
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    Test and debug strategy for TSMC CoWoS stacking process-based heterogeneous 3D-IC: A silicon study

    Goel, Sandeep K.
    ;
    Adham, Saman
    ;
    Wang, Min-Jer
    ;
    Lee, Frank
    ;
    Chickermane, Vivek
    ;
    Keller, Brion
    Book chapter
    2019-03

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