Publication:

DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks

Date

2012-11

Proceedings Paper

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Author(s)

Deutsch, Sergej

;

;

Chickermane, Vivek

;

Mukherjee, Subhasish

;

;

Goel, Sandeep K.

;

;

;

;

Marinissen, Erik Jan

Statistics

1919 since deposited on 2021-10-20

Acq. date: 2026-04-05