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Browsing by Author "Lee, Jam-Wem"

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    Publication

    Impacts of process options on ESD device characteristics in sub-20nm bulk FinFET technology nodes

    Chen, Shih-Hung  
    ;
    Lee, Jam-Wem
    ;
    Linten, Dimitri  
    ;
    Scholz, Mirko
    ;
    Song, Ming-Hsiang
    ;
    Hellings, Geert  
    Meeting abstract
    2014-12, IEEE International Electron Devices Meeting - IEDM, 15/12/2014, p.514-517

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