Browsing by Author "Lee, Shih Chung"
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Publication Characteristics of low-energy nitrogen ion-implanted oxide and NO-annealed gate dielectrics
Journal article2004, Solid-State Electronics, (48) 9, p.1687-1690Publication Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors
; Claeys, CorProceedings paper2005, Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF, 19/09/2005, p.331-334