Browsing by Author "Leroux, C."
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Publication Electrical modeling and simulation of nanoscale MOS devices with a high-permittivity dielectric gate stack
Proceedings paper2004, Integration of Advanced Micro- and Nanoelectronic Devices - Critical Issues and Solutions, 12/04/2004, p.D6.1Publication Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures
;Marchand, B. ;Cretu, B. ;Ghibaudo, G. ;Balestra, F. ;Blachier, D. ;Leroux, C.Deleonibus, S.Journal article2002, Solid-State Electronics, (46) 3, p.337-342