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Browsing by Author "Li, Y"

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    Publication

    Gate stack engineering to enhance high- $j/metal gate reliability for DRAM I/O applications

    O'Sullivan, Barry  
    ;
    Ritzenthaler, Romain  
    ;
    Simoen, Eddy  
    ;
    Dentoni Litta, Eugenio  
    ;
    Schram, Tom  
    Proceedings paper
    2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.DG-8.1-DG-8.5

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