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Browsing by Author "Liang, Renrong"

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    Publication

    Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs

    Chang, Hao
    ;
    Zhang, Yongkui
    ;
    Zhou, Longda
    ;
    Ji, Zhigang
    ;
    Yang, Hong
    ;
    Liu, Qianqian
    ;
    Li, Yongliang
    Proceedings paper
    2021, IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), SEP 14-OCT 13, 2021

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