Browsing by Author "Liang, Renrong"
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Publication Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
;Chang, Hao ;Zhang, Yongkui ;Zhou, Longda ;Ji, Zhigang ;Yang, Hong ;Liu, QianqianLi, YongliangProceedings paper2021, IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), SEP 14-OCT 13, 2021