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Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Publication:
Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Date
2021
Proceedings Paper
https://doi.org/10.1109/IPFA53173.2021.9617433
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chang, Hao
;
Zhang, Yongkui
;
Zhou, Longda
;
Ji, Zhigang
;
Yang, Hong
;
Liu, Qianqian
;
Li, Yongliang
;
Liang, Renrong
;
Simoen, Eddy
;
Zhu, Huilong
;
Luo, Jun
;
Wang, Wenwu
Journal
na
Abstract
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1754
since deposited on 2022-04-28
Acq. date: 2025-10-23
Citations
Metrics
Views
1754
since deposited on 2022-04-28
Acq. date: 2025-10-23
Citations