Publication:
Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Loading...
Journal
Abstract
Description
Statistics
Views
1759 since deposited on 2022-04-28
1last month
1last week
Acq. date: 2026-03-16
Citations
Statistics
Views
1759 since deposited on 2022-04-28
1last month
1last week
Acq. date: 2026-03-16
Citations