Browsing by Author "Liao, Wenjun"
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Publication Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors
;Jiang, Rong ;Zhang, En Xia ;Liao, Wenjun ;Liang, Chundong ;Fleetwood, DanielSchrimpf, RonaldJournal article2018, IEEE Transactions on Nuclear Science, (65) 1, p.175-183Publication X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices
Journal article2018, IEEE Transactions on Nuclear Science, (65) 8, p.1519-1524