Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Jiang, Rong; Zhang, En Xia; Liao, Wenjun; Liang, Chundong; Fleetwood, Daniel; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri; Mitard, Jerome; Collaert, Nadine; Sioncke, Sonja; Waldron, Niamh

Publication:

Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Date

2018

Journal article

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

;

;

;

;

;

;

Journal

IEEE Transactions on Nuclear Science

Statistics

2106 since deposited on 2021-10-25

1last month

1last week

Acq. date: 2026-05-16

Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Date

Author(s)

Journal

Abstract

Description

Statistics

Views

Citations

Statistics

Views

Citations