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Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors
Publication:
Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors
Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jiang, Rong
;
Zhang, En Xia
;
Liao, Wenjun
;
Liang, Chundong
;
Fleetwood, Daniel
;
Schrimpf, Ronald
;
Reed, Robert
;
Linten, Dimitri
;
Mitard, Jerome
;
Collaert, Nadine
;
Sioncke, Sonja
;
Waldron, Niamh
Journal
IEEE Transactions on Nuclear Science
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2095
since deposited on 2021-10-25
Acq. date: 2025-10-23
Citations
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Views
2095
since deposited on 2021-10-25
Acq. date: 2025-10-23
Citations