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Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Date

2018
Journal article
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dc.contributor.authorJiang, Rong
dc.contributor.authorZhang, En Xia
dc.contributor.authorLiao, Wenjun
dc.contributor.authorLiang, Chundong
dc.contributor.authorFleetwood, Daniel
dc.contributor.authorSchrimpf, Ronald
dc.contributor.authorReed, Robert
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMitard, Jerome
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSioncke, Sonja
dc.contributor.authorWaldron, Niamh
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-25T20:25:04Z
dc.date.available2021-10-25T20:25:04Z
dc.date.issued2018
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30972
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8063356/
dc.source.beginpage175
dc.source.endpage183
dc.source.issue1
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.volume65
dc.title

Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

dc.typeJournal article
dspace.entity.typePublication
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