Browsing by Author "Lin, D."
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Publication Justifications for reducing HBM and MM ESD qualification test time
;Verhaege, Koen ;Robinson-Hahn, D. ;Russ, Christian ;Farris, M. ;Scanlon, J. ;Lin, D.Veltri, J.Journal article1996, Microelectronics and Reliability, 36, p.1715-1718