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Browsing by Author "Lin, D."

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    Publication

    Justifications for reducing HBM and MM ESD qualification test time

    Verhaege, Koen
    ;
    Robinson-Hahn, D.
    ;
    Russ, Christian
    ;
    Farris, M.
    ;
    Scanlon, J.
    ;
    Lin, D.
    ;
    Veltri, J.
    Journal article
    1996, Microelectronics and Reliability, 36, p.1715-1718

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