Browsing by Author "Lin, H.C."
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Publication Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces
Meeting abstract2008, 214th ECS Meeting, 12/10/2008, p.1973Publication Capacitance-voltage (CV)characterization of GaAs-oxide interfaces
Proceedings paper2008, Physics and Technology of High-k Dielectrics 6, 12/10/2008, p.507-519Publication Electrical properties of III-V/oxide interfaces
Proceedings paper2009, Graphene and Emerging Materials for Post-CMOS Applications, 24/05/2009, p.375-386