Publication:

Capacitance-voltage (CV)characterization of GaAs-oxide interfaces

Date

2008

Proceedings Paper

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Files

17138.pdf 768.61 KB

Author(s)

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Merckling, Clement

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Adelmann, Christoph

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Metrics

2004 since deposited on 2021-10-17

Acq. date: 2026-01-11