Browsing by Author "Lin, Yongjin"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Vertically stacked gate-all-around Si nanowire CMOS transistors with reduced nanowires separation, new work function metal gate solutions, and DC/AC performance optimization
Proceedings paper2018, IEEE International Electron Devices Meeting - IEDM, 2/12/2018, p.508-511