Browsing by Author "Liyang, Pan"
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Publication Assessment methodology of the lateral migration component in data retention of 3D SONOS memories
Journal article2014, Microelectronics Reliability, (54) 9_10, p.1697-1701Publication Reliability comparison of ISSG oxide and HTO as tunnel dielectric in 3-D–SONOS applications
Journal article2013, IEEE Electron Device Letters, (34) 5, p.620-622