Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Assessment methodology of the lateral migration component in data retention of 3D SONOS memories
Publication:
Assessment methodology of the lateral migration component in data retention of 3D SONOS memories
Date
2014
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Liu, Lifang
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Liyang, Pan
;
Van Houdt, Jan
Journal
Microelectronics Reliability
Abstract
Description
Metrics
Views
1908
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1908
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations