Assessment methodology of the lateral migration component in data retention of 3D SONOS memories

dc.contributor.author	Liu, Lifang
dc.contributor.author	Arreghini, Antonio
dc.contributor.author	Van den Bosch, Geert
dc.contributor.author	Liyang, Pan
dc.contributor.author	Van Houdt, Jan
dc.contributor.imecauthor	Arreghini, Antonio
dc.contributor.imecauthor	Van den Bosch, Geert
dc.contributor.imecauthor	Van Houdt, Jan
dc.contributor.orcidimec	Arreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimec	Van den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimec	Van Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned	2021-10-22T03:10:11Z
dc.date.available	2021-10-22T03:10:11Z
dc.date.issued	2014
dc.identifier.issn	0026-2714
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/24151
dc.identifier.url	http://www.sciencedirect.com/science/article/pii/S0026271414002662
dc.source.beginpage	1697
dc.source.endpage	1701
dc.source.issue	9_10
dc.source.journal	Microelectronics Reliability
dc.source.volume	54
dc.title	Assessment methodology of the lateral migration component in data retention of 3D SONOS memories
dc.type	Journal article
dspace.entity.type	Publication
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