Browsing by Author "Lobato, I."

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Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection

Fatermans, J.
;
den Dekker, Arnold Jan
;
Müller-Caspary, K.
;
Lobato, I.
;
Van Aert, S.
Meeting abstract
2018, 69th Annual Meeting of the Nordic Microscopy Society - SCANDEM, 25/06/2018, p.G-O4
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images

Fatermans, J.
;
den dekker, Arnold Jan
;
Müller-Caspary, K.
;
Lobato, I.
;
Van Aert, Sandra
Meeting abstract
2018, 19th International Microscopy Congress - IMC19, 9/09/2018