Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection

Publication:

2018

Meeting abstract

Author(s)

Fatermans, J.

;

den Dekker, Arnold Jan

;

Müller-Caspary, K.

;

Lobato, I.

;

Van Aert, S.

1930 since deposited on 2021-10-25

Acq. date: 2026-04-26