Publication:
Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
Date
| dc.contributor.author | Fatermans, J. | |
| dc.contributor.author | den Dekker, Arnold Jan | |
| dc.contributor.author | Müller-Caspary, K. | |
| dc.contributor.author | Lobato, I. | |
| dc.contributor.author | Van Aert, S. | |
| dc.date.accessioned | 2021-10-25T18:34:07Z | |
| dc.date.available | 2021-10-25T18:34:07Z | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30693 | |
| dc.identifier.url | https://issuu.com/dtudanchipcen/docs/scandem_book_of_abstracts_25_june_2 | |
| dc.source.beginpage | G-O4 | |
| dc.source.conference | 69th Annual Meeting of the Nordic Microscopy Society - SCANDEM | |
| dc.source.conferencedate | 25/06/2018 | |
| dc.source.conferencelocation | Lyngby Denmark | |
| dc.title | Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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