Browsing by Author "Lora-Tamayo, E."

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Determination of the film thickness of SIMOX substrates using simple calibration curves

Badenes, Gonçal
;
Losantos, P.
;
Cane, C.
;
Lora-Tamayo, E.
Proceedings paper
1997, CDE-97 : Actas de la 1a Conferencia de Dispositivos Electrónicos (EDC - Proceedings of the Electronic Devices Conference); 20-21, p.515-9
Test structures for MCM-D technology characterization

Lozano, M.
;
Santander, J.
;
Cabruja, E.
;
Perello, Carles
;
Ullan, M.
;
Lora-Tamayo, E.
;
Doyle, R.
Journal article
1999, IEEE Trans. Semiconductor Manufacturing, (12) 2, p.184-192