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Browsing by Author "Lozano, M."

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    Analysis of oxygen thermal donor formation in n-type CZ silicon

    Rafi, Joan Marc
    ;
    Simoen, Eddy  
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    Claeys, Cor
    ;
    Ulyashin, A.G.
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    Job, R.
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    Fahrner, W.R.
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    Versluys, J.
    Proceedings paper
    2003, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes, 28/04/2003, p.96-105
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    Degradation of high resistivity silicon float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

    Rafi, J.M.
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    Boulord, C.
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    Hayama, K.
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    Ohyama, H.
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    Campabadal, F.
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    Pellegrini, G.
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    Lozano, M.
    Oral presentation
    2008, 8th International Conference on Position Sensitive Detectors
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    Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

    Rafi, J.M.
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    Boulord, C.
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    Hayama, K.
    ;
    Ohyama, H.
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    Campabadal, F.
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    Pellegrini, G.
    ;
    Lozano, M.
    Journal article
    2009, Nuclear Instruments and Methods in Physics Research A, 604, p.258-261
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    Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors

    Rafi, J.M.
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    Cardona-Safont, L.
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    Zabala, M.
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    Boulord, C.
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    Campabadal, F.
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    Pellegrini, G.
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    Lozano, M.
    Proceedings paper
    2008, Gettering and Defect Engineering in Semiconductor Technology XII, 14/10/2007, p.431-436
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    High-energy proton irradiation effects on tunnelling MOS capacitors

    Fleta, C.
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    Campabadal, F.
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    Rafi, Joan Marc
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    Lozano, M.
    ;
    Ulan, M.
    Journal article
    2004, Microelectronic Engineering, (72) 1_4, p.85-89
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    Hydrogen-induced thermal donor formation in n-type oxygenated high-resistivity FZ silicon

    Rafi, Joan Marc
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Ulyashin, A.G.
    ;
    Job, R.
    ;
    Fahrner, W.R.
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    Versluys, J.
    Proceedings paper
    2002, Proceedings of the 5th Annual Workshop on Semiconductor Advances for Future Electronics - SAFE, 26/11/2002, p.91-98
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    Impact of direct plasma hydrogenation on thermal donor formation in N-type CZ silicon

    Rafi, Joan Marc
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Huang, Y.L.
    ;
    Ulyashin, A.G.
    ;
    Job, R.
    ;
    Versluys, J.
    Journal article
    2005, Journal of the Electrochemical Society, (152) 1, p.G16-G24
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    Test structures for MCM-D technology characterization

    Lozano, M.
    ;
    Santander, J.
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    Cabruja, E.
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    Perello, Carles
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    Ullan, M.
    ;
    Lora-Tamayo, E.
    ;
    Doyle, R.
    Journal article
    1999, IEEE Trans. Semiconductor Manufacturing, (12) 2, p.184-192

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