Browsing by Author "Luchies, J. M."
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Publication Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Journal article1997, IEEE Trans. Electron Devices, (44) 11, p.1972-1980Publication NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Proceedings paper1995, Proceedings of the 6th ESREF Conference, 3/10/1995, p.117-125