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Browsing by Author "Luo, J."

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    160 Gb/s optical packet switch module employing SOI integrated label extractor

    Di Lucente, S.
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    De Heyn, Peter  
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    Luo, J.
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    Van Thourhout, Dries  
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    Dorren, H.J.S.
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    Calabretta, N.
    Proceedings paper
    2013, 18th OptoElectronics and Communications Conference held jointly with International Conference on Photonics in Switching- OECC/PS, 30/06/2013, p.Tut3-1
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    A compact integrated 40Gb/s packet demultiplexer and label extractor on silicon-on-insulator for an optical packet switch

    De Heyn, Peter  
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    Luo, J.
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    Trita, Andrea
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    Pathak, Shibnath
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    Di Lucente, S.
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    Dorren, H.
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    Calabretta, N.
    Proceedings paper
    2013, 39th European Conference and Exhibition on Optical Communication - ECOC, 22/09/2013, p.Th.2.A.5
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    Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs

    Zhou, L.
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    Liu, Q.
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    Yang, H.
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    Ji, Z.
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    Xu, H.
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    Tang, B.
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    Simoen, Eddy  
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    Jiang, H.
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    Luo, Y.
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    Wang, X.
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    Ma, X.
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    Li, Y.
    Journal article
    2020, IEEE Transactions on Device and Materials Reliability, (20) 3, p.498-505
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    Reduction of NiGe/n- and p-Ge specific contact resistivity by enhanced dopant segregation in the presence of carbon during nickel germanidation

    Duan, N.
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    Luo, J.
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    Wang, G.
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    Liu, J.
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    Simoen, Eddy  
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    Mao, S.
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    Radamson, H.
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    Wang, X.
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    Li, J.
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    Wang, W.
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    Zhao, C.
    Journal article
    2016, IEEE Transactions on Electron Devices, (63) 11, p.4546-4549
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    Silicon-organic hybrid (SOH) modulators for intensity-modulation / direct-detection links with line rates of up to 120 Gbit/s

    Zwickel, H.
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    Wolf, S
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    Kieninger, C.
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    Ku-Tuvantavida, Y.
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    Lauermann, M.
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    De Keulenaer, Timothy
    Journal article
    2017-10, Optics Express, (25) 20, p.23784-23800
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    Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs

    Zhou, L.
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    Zhang, Q.
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    Yang, H.
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    Ji, Z.
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    Zhang, Z.
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    Liu, Q.
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    Xu, H.
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    Tang, B.
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    Simoen, Eddy  
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    Ma, X.
    ;
    Wang, X.
    Journal article
    2020, IEEE Electron Device Letters, (41) 7, p.965-968

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