Browsing by Author "Madia, O."
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Experimental characterization of BTI defects
; ; ; Publication Impact of strain on the passivation efficiency of Ge dangling bond interface defects in condensation grown SiO2/GeSi1-x/SiO2/(100)Si structures with nm-thin GexSi1-x layers
Journal article2014, Applied Surface Science, 291, p.11-15