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Browsing by Author "Mann, Klaus"

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    Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral range

    Barkusky, Frank
    ;
    Peth, Christian
    ;
    Bayer, Armin
    ;
    Mann, Klaus
    ;
    John, Joachim  
    ;
    Malinowski, Pawel  
    Journal article
    2009, Review of Scientific Instruments, (80) 9, p.93102
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    Radiation hardness of Al(x)Ga(1-x)N photodetectors exposed to Extreme UltraViolet (EUV) light beam

    Malinowski, Pawel  
    ;
    John, Joachim  
    ;
    Lorenz, Anne
    ;
    Cheng, Kai
    ;
    Derluyn, Joff
    ;
    Germain, Marianne
    Proceedings paper
    2009, European Optics & Optoelectronics Symposium, 20/04/2009

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