Browsing by Author "Marchand, B."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures
;Marchand, B. ;Cretu, B. ;Ghibaudo, G. ;Balestra, F. ;Blachier, D. ;Leroux, C.Deleonibus, S.Journal article2002, Solid-State Electronics, (46) 3, p.337-342