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Browsing by Author "Matsuzaki, M."

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    Study of degradation mechanism by isothermal annealing of SOI FinFET after electron irradiation

    Matsuki, K.
    ;
    Matsuzaki, M.
    ;
    Yoneoka, M.
    ;
    Tsunoda, I.
    ;
    Takakura, Kenichiro  
    ;
    Simoen, Eddy  
    Proceedings paper
    2017, 29th International Conference on Defects in Semiconductors - ICDS, 31/07/2017

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