Publication:
Study of degradation mechanism by isothermal annealing of SOI FinFET after electron irradiation
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1986 since deposited on 2021-10-24
2last month
Acq. date: 2026-01-11
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Metrics
Views
1986 since deposited on 2021-10-24
2last month
Acq. date: 2026-01-11
Citations