Browsing by Author "McNally, P.J."
Now showing 1 - 3 of 3
- Results Per Page
- Sort Options
Publication B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages
Journal article2016, Microelectronics Reliability, 59, p.108-116Publication Determination of crystal misorientation in epitaxial lateral overgrowth of GaN
Publication Development of B-spline x-ray diffraction imaging techniques for die warpage and stress monitoring inside fully encapsulated packaged chips
Proceedings paper2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.1517-1522