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Browsing by Author "Mechri, C."

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    Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry

    Ruello, P.
    ;
    Lomonosov, A.
    ;
    Ayouch, A.
    ;
    Mechri, C.
    ;
    Baklanov, Mikhaïl
    ;
    Verdonck, Patrick  
    ;
    Zhao, Larry
    Meeting abstract
    2011, 5th Conference on Emerging Technologies in Non Destructive Testing ETNDT, 19/09/2011, p.59
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    Engineering of chemical and physical properties of low-k materials by different wavelength of UV light

    Baklanov, Mikhaïl
    ;
    Marsik, Premysl
    ;
    Verdonck, Patrick  
    ;
    Ferchichi, Abdelkarim
    ;
    Urbanowicz, Adam
    Proceedings paper
    2008, ADMETA: Advanced Metallization Conference, 8/10/2008, p.28-29
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    Opto-acousto-optic evaluation of the physical properties of nanoporous materials

    Mechri, C.
    ;
    Ruello, P.
    ;
    Mounier, D.
    ;
    Breteau, J.M.
    ;
    Edely, M.
    ;
    Minhao, Y.
    ;
    Gibaud, A.
    ;
    Povey, I.
    Meeting abstract
    2008, Acoustics, 29/06/2008

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