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Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry
Publication:
Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry
Date
2011
Meeting abstract
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22330.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ruello, P.
;
Lomonosov, A.
;
Ayouch, A.
;
Mechri, C.
;
Baklanov, Mikhaïl
;
Verdonck, Patrick
;
Zhao, Larry
;
Gusev, V.
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Abstract
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1898
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1898
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations