Publication:

Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry

Date

2011
Meeting abstract
Simple item page Full metadata Statistics
 
dc.contributor.authorRuello, P.
dc.contributor.authorLomonosov, A.
dc.contributor.authorAyouch, A.
dc.contributor.authorMechri, C.
dc.contributor.authorBaklanov, Mikhaïl
dc.contributor.authorVerdonck, Patrick
dc.contributor.authorZhao, Larry
dc.contributor.authorGusev, V.
dc.contributor.imecauthorVerdonck, Patrick
dc.contributor.orcidimecVerdonck, Patrick::0000-0003-2454-0602
dc.date.accessioned2021-10-19T18:20:01Z
dc.date.available2021-10-19T18:20:01Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19714
dc.source.beginpage59
dc.source.conference5th Conference on Emerging Technologies in Non Destructive Testing ETNDT
dc.source.conferencedate19/09/2011
dc.source.conferencelocationIoannina Greece
dc.title

Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry

dc.typeMeeting abstract
dspace.entity.typePublication
Files

Original bundle

Name:
22330.pdf
Size:
379.94 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions