Browsing by Author "Mehrotra, S.R."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Interface trap density metrology of state-of-the-art undoped Si n-FinFETs
Journal article2011, IEEE Electron Device Letters, (32) 4, p.440-443
Interface trap density metrology of state-of-the-art undoped Si n-FinFETs