Browsing by Author "Mei, S"
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Publication New understanding of dielectric breakdown in advanced FinFET devices – physical, electrical, statistical and multiphysics study
;Mei, S ;Bosman, M. ;Raghavan, N.; ; ; Pey, K.L.Proceedings paper2016, IEEE International Devices Meeting - IEDM, 3/12/2016, p.397-398