Browsing by Author "Meunier-Beillard, P."
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Publication Quantitative prediction of junction leakage in bulk-technology CMOS devices
;Duffy, R. ;Heringa, A. ;Venezia, V.C. ;Loo, Josine ;Verheijen, M.A.Hopstaken, M.J.P.Journal article2010, Solid-State Electronics, (54) 3, p.243-251