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Browsing by Author "Meunier-Beillard, P."

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    Publication

    Quantitative prediction of junction leakage in bulk-technology CMOS devices

    Duffy, R.
    ;
    Heringa, A.
    ;
    Venezia, V.C.
    ;
    Loo, Josine
    ;
    Verheijen, M.A.
    ;
    Hopstaken, M.J.P.
    Journal article
    2010, Solid-State Electronics, (54) 3, p.243-251

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