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Browsing by Author "Midorikawa, M."

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    Effects of electron and proton radiation on embedded SiGe source/drain diodes

    Ohyama, H.
    ;
    Nagano, T.
    ;
    Takakura, K.
    ;
    Motoki, M.
    ;
    Matsuo, M.
    ;
    Nakamura, H.
    ;
    Sawada, M.
    ;
    Midorikawa, M.
    Journal article
    2008, Materials Science in Semiconductor Processing, (11) 5_6, p.310-313
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    Radiation damage of Ge-on-Si devices

    Ohyama, H.
    ;
    Sakamoto, K.
    ;
    Sukizaki, H.
    ;
    Takakura, K.
    ;
    Hayama, K.
    ;
    Motoki, M.
    ;
    Matsuo, K.
    ;
    Nakamura, H.
    Journal article
    2008, Materials Science in Semiconductor Processing, (11) 5_6, p.217-220

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