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Browsing by Author "Miura, T."

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    Defect assessment of irradiated STI Diodes

    Ohyama, Hidenori
    ;
    Hayama, Kiyoteru
    ;
    Miura, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Poyai, Amporn
    Journal article
    2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.424-428
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    Defect assessment of irradiated STI diodes

    Ohyama, Hidenori
    ;
    Hayama, Kiyoteru
    ;
    Miura, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Poyai, Amporn
    Oral presentation
    2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,
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    Influence of irradiation temperature on electron-irradiated STI Si diodes

    Ohyama, Hidenori
    ;
    Hayama, Kiyoteru
    ;
    Takakura, K.
    ;
    Miura, T.
    ;
    Jono, T.
    ;
    Simoen, Eddy  
    ;
    Poyai, Amporn
    Proceedings paper
    2002, Proceedings of the 4th International Conference on Materials for Microelectronics, 10/06/2002, p.299-302
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    Influence of irradiation temperature on electron-irradiated STI Si diodes

    Ohyama, H.
    ;
    Hayama, K.
    ;
    Takakura, K.
    ;
    Miura, T.
    ;
    Shigaki, K.
    ;
    Jono, T.
    ;
    Simoen, Eddy  
    ;
    Poyai, Amporn
    Journal article
    2003, Journal of Materials Science: Materials in Electronics, (14) 5_7, p.451-454
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    Radiation damage in shallow trench isolation diodes

    Hayama, K.
    ;
    Ohyama, H.
    ;
    Miura, T.
    ;
    Poyai, Amporn
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Kobayashi, K.
    Proceedings paper
    2001, Proceedings of the International Conference on Electrical Engineering - ICEE, 22/07/2001, p.1720-1723
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    Radiation damages in STI diodes after high temperature electron-irradiation

    Ohyama, H.
    ;
    Hayama, K.
    ;
    Takakura, K.
    ;
    Miura, T.
    ;
    Simoen, Eddy  
    ;
    Poyai, Amporn
    ;
    Takami, Y.
    ;
    Claeys, Cor
    Oral presentation
    2002, RADECS Workshop
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    Radiation defects in Sti silicon diodes and their effects on device performance

    Hayama, Kiyoteru
    ;
    Ohyama, Hidenori
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Poyai, Amporn
    ;
    Miura, T.
    Journal article
    2001, Physica B, 308, p.1217-1221

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