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Browsing by Author "Mlynarczyk, K."

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    On the characterisation of grown-in defects in Czocharski-grown Si and Ge

    Vanhellemont, Jan
    ;
    Van Steenbergen, Jan  
    ;
    Holsteyns, Frank  
    ;
    Roussel, Philippe  
    ;
    Meuris, Marc  
    Journal article
    2008, Journal of Materials Science: Materials in Electronics, (19) Suppl.1, p.S24-S31

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