Publication:

On the characterisation of grown-in defects in Czocharski-grown Si and Ge

Date

2008

Journal article

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Files

14897.pdf 97.28 KB

Author(s)

Vanhellemont, Jan

;

Van Steenbergen, Jan

;

Holsteyns, Frank

;

Roussel, Philippe

;

;

;

;

;

Journal

Journal of Materials Science: Materials in Electronics

Statistics

1912 since deposited on 2021-10-17

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Acq. date: 2026-04-06