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On the characterisation of grown-in defects in Czocharski-grown Si and Ge
Publication:
On the characterisation of grown-in defects in Czocharski-grown Si and Ge
Date
2008
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Van Steenbergen, Jan
;
Holsteyns, Frank
;
Roussel, Philippe
;
Meuris, Marc
;
Mlynarczyk, K.
;
Spiewak, P.
;
Geens, Wim
;
Romandic, I.
Journal
Journal of Materials Science: Materials in Electronics
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1906
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1906
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations