Browsing by Author "Mogilnikov, K.P."

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A discussion of the practical importance of positron annihilation lifetime spectroscopy percolation threshold in evaluation of porous low-k dielectrics

Mogilnikov, K.P.
;
Baklanov, Mikhaïl
;
Shamiryan, Denis
;
Petkov, M.P.
Journal article
2004-01, Japanese Journal of Applied Physics. Part 1: Regular Papers, (43) 1, p.247-248
Ellipsometric porosimetry of porous low-k films with quazi-closed cavities

Baklanov, Mikhaïl
;
Mogilnikov, K.P.
;
Yim, J-H.
Proceedings paper
2004, Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, 12/04/2004, p.55-60
Internal matrix structure of low-k nanoporous silica and its relation to mechanical properties

Saxena, R.
;
Rodriguez, O.
;
Cho, W.
;
Gills, W.N.
;
Plawsky, J.L.
;
Baklanov, Mikhaïl
;
Mogilnikov, K.P.
Journal article
2004-12, Journal of Non-Chrystalline Solids, 349, p.189-199