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Ellipsometric porosimetry of porous low-k films with quazi-closed cavities
Publication:
Ellipsometric porosimetry of porous low-k films with quazi-closed cavities
Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Mogilnikov, K.P.
;
Yim, J-H.
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1822
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1822
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations