Browsing by Author "Mouthaan, A. J."

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Early resistance change and stress/electromigration modeling in aluminum interconnects

Petrescu, Violeta
;
Mouthaan, A. J.
;
Schoenmaker, Wim
Proceedings paper
1997, Proceedings of 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 97; October 1997., p.1491-1494
Early resistance change and stress/electromigration modeling in aluminum interconnects

Petrescu, Violeta
;
Mouthaan, A. J.
;
Schoenmaker, Wim
Journal article
1997, Microelectronics and Reliability, (37) 10_11, p.1491-1494